YOLO-CSL: a lightweight real-time fabric defect segmentation network for industrial detection
Year: 2026
Type: article
Source: Journal of the Textile Institute
Authors: Shiye Chen, Zhumin Chen
Institution: Shanghai Polytechnic University
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W7208817820