Tham-Additive-Induced Electric Double Layer Compression and Stabilization Enable Dendrite-Free Zinc Anodes under High Current
Year: 2026
Type: article
Authors: Jinghua Liu, Xue Shu, Ziyi Yang, Zhonglin Wang, Rongfu Wang, Yiling Fang, Dandan Long, Min Mao, He Ma, Zhongliang Li, Yuepeng Cai
Institutions: Hengyang Normal University, South China Normal University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G1577106664
OpenAlex ID: W7212191473