Work

Bias-Induced Crossover in Absolute Capacity of Dense Associative Memory

Year: 2026

Type: preprint

Abstract: The absolute capacity of dense associative memory has mainly been analyzed for unbiased patterns. Here we examine the effect of bias in centered binary patterns under the Krotov-Hopfield single-site criterion $P_{\mathrm{error}}=1/N$, where $P_{\mathrm{error}}$ is the probability that a single-site flip lowers the energy of a stored pattern and $N$ is the number of neurons. Each pattern component takes $1-q$ with probability $q$ and $-q$ otherwise, where $0

Source: arXiv (Cornell University)

DOI: 10.48550/arxiv.2609.17477

Authors: Sakurai, Yuto, Shimokawa, Takeaki, Iwata, Kazunori, Mimura, Kazushi

Institutions: Hiroshima City University, RIKEN Center for Advanced Intelligence Project, The University of Tokyo

Language: English

Topic: Neural Networks and Applications

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W7213433421

Cites: 1

Cited by:

Related to: 10