Work

Reliability and Performance Enhancement in Ultra-Scaled Advanced CMOS and Memory Devices

Year: 2026

Type: dissertation

Source: eScholarship (California Digital Library)

Author: Lee, Dasom

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7213483029

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