Nanoparticle Analysis for Reference Materials: The Small-Angle X-ray Scattering Method
Year: 2026
Type: article
Abstract: Reliable certification of nanoparticle reference materials is crucial for advancing nanoparticle analysis. Here, we demonstrate the use of small-angle X-ray scattering (SAXS) as a robust method for certifying a silver nanoparticle reference material (BAM-N008) exhibiting exceptional long-term stability─maintaining its properties for at least 10 years without special storage precautions. Comprehensive characterization in accordance with ISO 17867 and ISO 23484 supports the suitability of SAXS for nanoparticle metrology. Homogeneity and stability studies underpin value assignment and uncertainty evaluation, with metrologically traceable values established for particle diameter and number density, and reference values assigned for the width of the size distribution and particle mass concentration. The assigned values are D = 5.8 nm, σ = 1.33 nm, N = 3.7 × 10–6 mol L–1, and c = 3.0 g L–1, with expanded uncertainties (k = 2) of 9%, 14%, 19%, and 17%, respectively. These results provide a reliable basis for validating and verifying analytical methods for nanoparticle dispersion analysis.
Source: Langmuir
Author: Andreas F. Thünemann
Institution: Federal Institute For Materials Research and Testing
Language: English
Subfield: Statistics, Probability and Uncertainty
Field: Decision Sciences
Domain: Social Sciences
Open Access status: hybrid
Estimated APC paid: $4,500
OpenAlex ID: W7214067721