Work

Achieving 5-angstrom-resolution diffraction contrast with an uncorrected electron probe and nanosized defect characterizations

Year: 2026

Type: preprint

Abstract: Atomic-resolution micrographs remain limited in application due to small field of view and low numbers of recorded defects. Defect imaging with reliable statistics in transmission electron microscopy (TEM) relies heavily on diffraction contrast. However, with 200-300 kV electrons, low-curvature Ewald sphere limits diffraction resolution at ~5 nm. Here, we imaged defects with a forbidden condition in TEM and improved the resolution in diffraction contrast from 5 to 0.5 nm. The superiority of our equal-s method is demonstrated by the discovery of a novel phase and dislocation loop structure in steels, which have not been previously reported experimentally or theoretically. Our equal-s can largely replace the classical two-beam condition for defect study.

Source: arXiv (Cornell University)

DOI: 10.48550/arxiv.2609.28096

Authors: Li, Yao, Houston, Austin C., Yu, Ziang, Qi, Zehui, Chen, Siwei, Zhao, Yajie, Kim, Sung Joo, Zinkle, Steven J., Duscher, Gerd, Uberuaga, Blas P., Derby, Benjamin K.

Institutions: Los Alamos National Laboratory, Center for Integrated Nanotechnologies, University of Tennessee at Knoxville, University of Wisconsin–Madison, Woodward (United States)

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: green

Funders: U.S. Department of Energy, Office of Science, National Nuclear Security Administration, Basic Energy Sciences, Los Alamos National Laboratory

Awards: G1017065088, G1279347439, G1527848044, G3137353516, G6410514744, G6563880843

OpenAlex ID: W7214180940

Cites: 1

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Related to: 10