Work

Digital Image Correlation-Based Non-Destructive Defect Inspection of Additive Manufactured Metamaterials

Year: 2026

Type: conference-paper

Source: IISE Annual Conference & Expo

DOI: 10.21872/annual2025_6591

Authors: Tianyu Gao, Jia Liu, Rongxuan Wang, Chen Kan

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W7214916030

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