Work

Investigation of LVI Application for Nanosheet Devices

Year: 2026

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2026p0175

Authors: Zhigang Song, Alberto Cestero, Mike Iwatake, Yandong Liu, Jochonia Nxumalo, Qianheng Du, Yu Zhu

Institution: IBM Research - Albany

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7214946489

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