Work

Predicting electric-field noise in ion traps using fluctuation electrodynamics

Year: 2026

Type: preprint

Abstract: Electric-field noise in microfabricated surface ion traps contributes to gate errors in trapped-ion quantum computers, but this noise has been challenging to predict. Here, we present a method to predict the electric-field noise arising from fluctuations in the bulk of dielectric and metallic materials. The method is valid for arbitrary trap geometries, and the only relevant material property is energy loss. We apply it to an ion trap with an electrically floating electrode and find the contribution from dielectrics to be dominant. Our model predicts the observed noise for this trap within a factor of four. In addition, we apply our model to typical surface trap designs and analyze how the electrode structures shield the noise.

Source: arXiv (Cornell University)

DOI: 10.48550/arxiv.2610.01693

Authors: Teller, Markus, An, Da, Alonso, Alberto M., Holz, Philip C., Schindler, Philipp, Häffner, Hartmut, Northup, Tracy E.

Institutions: Institute of Photonic Sciences, Universität Innsbruck, Barcelona Institute of Science and Technology, University of California, Berkeley, Alpine Quantum Technologies (Austria), Lawrence Berkeley National Laboratory

Language: English

Topic: Quantum Information and Cryptography

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: green

Funders: U.S. Department of Energy, European Commission, Austrian Science Fund, Office of Science, HORIZON EUROPE Framework Programme, Advanced Scientific Computing Research

Awards: G1286236842, G1616335876, G1799333409, Quantum Internet Alliance - Phase1, G3136028036, G415594430, G419881185, G42916606, G4501827968, G4742037821, G498139845, G526230902, G6652958823, G980307288

OpenAlex ID: W7216524197

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