Year: 2026
Type: preprint
Abstract: Accurate lens surface metrology is essential to determine the manufactured geometry of refractive optical elements and their deviation from the specified design. We demonstrate a transmission metrology method that reconstructs refractive lens surfaces from the displacement of a wavelet-noise-patterned mask. Lens-induced distortion is represented by a dense displacement field. A differentiable ray tracer fits the lens geometry using a calibrated near-telecentric camera model with an effective finite ray origin. We validate the method on commercial lenses. The recovered geometries agree with nominal specifications, and the plano-aspheric reconstruction is compared with chromatic confocal profilometry.
Source: arXiv (Cornell University)
Institution: King Abdullah University of Science and Technology
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W7221817878