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Electrode-Dependent Phase Stabilization and Polarization Response in Hafnium Zirconium Oxide Thin Films

Year: 2026

Type: article

Source: ACS Applied Electronic Materials

DOI: 10.1021/acsaelm.6c01396

Authors: Garrett Baucom, Jinghan Gao, Tamanna Shaown, Yijia Gu, Toshikazu Nishida, Roozbeh Tabrizian, Honggyu Kim

Institutions: University of Florida, University of Michigan

Language: English

Topic: Ferroelectric and Negative Capacitance Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: University of Florida, Division of Materials Research

Award: G7248008038

OpenAlex ID: W7221824401

FWCI:

Cites: 72

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