kaquade/mechanical_stress_sib_aging: Analysis code for "Mechanical stress as the root cause for low-voltage degradation in commercial sodium-ion batteries" (v1.0.0)
Year: 2026
Type: software
Abstract: Analysis code accompanying the manuscript "Mechanical stress as the root cause for low-voltage degradation in commercial sodium-ion batteries" (submitted to Nature Energy). This release contains the code used to analyze: operando and end-of-life X-ray CT images electrochemical dilatometry data degradation modes (LSI, LAM_NE, LAM_PE) from qOCV measurements This is the version of the code used for the results reported in the manuscript. See README for installation and usage instructions.
Author: kaquade
Language: English
Subfield: Automotive Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W7222883175