Single-event upset response of the ITkPixV1.1 pixel readout chip with 24 GeV proton irradiation
Year: 2026
Type: article
Abstract: Single-event upsets (SEUs) in pixel frontend configuration registers can degrade data acquisition stability in the harsh hadron environment expected during high luminosity large hadron collider (HL-LHC) operation. We present a SEU irradiation campaign performed on an ITkPixV1.1 single chip card (SCC) exposed to a 24 GeV proton beam at the CERN IRRAD facility. The study targets the chip configuration registers, and SEU cross sections ( σ SEU ) are extracted as a function of the register protection scheme by comparing standard unprotected storage elements with triple modular redundancy (TMR) protected bits. SEUs are identified by repeated configuration programming and readback comparisons during irradiation, with no periodic reconfiguration was applied. Finally, we discuss operational mitigation techniques such as TMR and periodic reconfiguration in the context of expected HL-LHC upset rates. These results provide input for reliability projections and operational guidelines for the inner tracker (ITk) pixel readout during HL-LHC running.
Source: Journal of Instrumentation
Language: English
Subfield: Nuclear and High Energy Physics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: hybrid
Estimated APC paid: $3,290
OpenAlex ID: W7223315915