Work

Vacancy-Induced Ligand-Hole Character Redirects Oxygen Redox in Li-Rich Layered Oxides

Year: 2026

Type: article

Source: Journal of the American Chemical Society

DOI: 10.1021/jacs.6c17588

Authors: Jihun Jeong, Dayeon Choi, Lulu Lyu, Seongkoo Kang, Gi-Hyeok Lee, Hyungjun Kim, Wanli Yang, Yong-Mook Kang

Institutions: Korea University, Lawrence Berkeley National Laboratory, Kangwon National University

Language: English

Topic: Advancements in Battery Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7223472284

FWCI:

Cites: 43

Cited by:

Related to: