Synergistic Time‐Delay Integration X‐Ray Imaging with Pixelated Cs 3 Cu 2 I 5 Scintillators for High‐Fidelity In‐Line Inspection
Year: 2026
Type: article
Source: Advanced Optical Materials
DOI: 10.1002/adom.71970
Institution: Fuzhou University
Language: English
Subfield: Radiation
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W7223474405
