Work

Effects of a Shallow Trench Between Pixels on the Electrical and Photoresponse Characteristics of a SiPM

Year: 2026

Type: article

Source: Journal of the Institute of Electronics and Information Engineers

DOI: 10.5573/ieie.2026.63.10.17

Authors: Jongil Won, Dongyun Jung, Kunsik Park

Language: English

Topic: Radiation Detection and Scintillator Technologies

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7223560168

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