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Integrated MCNP Reliability Diagnosis Framework using Data-Driven Pattern Analysis and Physics-Informed Neural Network

Year: 2026

Type: article

Source: Journal of Korean institute of intelligent systems

DOI: 10.5391/jkiis.2026.36.5.420

Authors: Jin-Ho Jeong, Hyunsoo Lee

Language: English

Topic: Fault Detection and Control Systems

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7223657146

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