Work

Joint state recognition in scanning probe microscopy using spatial-frequency and scan-context learning

Year: 2026

Type: article

Source: Measurement Science and Technology

DOI: 10.1088/1361-6501/aeb965

Authors: XuZhuo Li, Zheng Dong, Zhi Liu, Ruisong Ma, Li Liu, Qing Huan

Institutions: Shandong University, Chinese Academy of Sciences, Institute of Physics

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7223689232

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