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Deep-learning-enhanced deflectometry for rapid surface measurement

Year: 2026

Type: article

Source: Journal of Modern Optics

DOI: 10.1080/09500340.2026.2747716

Authors: Songze Chen, Xukun Yang, Jie Wang, Haisen Yuan, Hao Xing, Chen Wei, Renjun Peng, Huimin Yue, Yong Liu

Institution: University of Electronic Science and Technology of China

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Natural Science Foundation of Sichuan Province

OpenAlex ID: W7224638897

FWCI:

Cites: 30

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Related to: 10