DWEE-YOLO: a frequency–edge–geometry enhanced YOLOv10 network for low-contrast fabric defect detection
Year: 2026
Type: article
Source: Journal of the Textile Institute
Authors: Angran Gao, Weizhen Wang, He Zhu
Institution: Dalian Polytechnic University
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W7225383376