Work

High-Reliability Ultrascaled IGZO FETs for Multibit 2T0C DRAM toward Monolithic 3D Integration of an AI Accelerator

Year: 2026

Type: article

Source: ACS Nano

DOI: 10.1021/acsnano.6c08923

Authors: Kexin Wang, Jianshi Tang, Yibei Zhang, Yanbo Su, Zhidong Tang, Yuankun Li, Yijia Fan, Huimin Yang, Gangping Yan, Xueli Ma, Jinjuan Xiang, Guilei Wang, Chao Zhao, Yue Xi, Bin Gao, Ning Deng, He Qian, Huaqiang Wu

Institution: Tsinghua University

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: National Natural Science Foundation of China, National Science and Technology Major Project

OpenAlex ID: W7225398919

FWCI:

Cites: 65

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Related to: 10