HfOx seed-layer functionalization of MoS2 for top-gated HZO FeFETs
Year: 2026
Type: article
Source: Journal of Applied Physics
DOI: 10.1063/5.0350349
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W7225426116
