Work

Development of a Low-Voltage Fault Detection Model for Metering Out Fit via Unsupervised Learning-Based Labeling of AMI Data

Year: 2026

Type: article

Source: The Transactions of The Korean Institute of Electrical Engineers

DOI: 10.5370/kiee.2026.75.11.3099

Authors: Jung-Kwon Kim, Woo-Jin Lee

Language: English

Topic: Electricity Theft Detection Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7225575513

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