Work

Operando Imaging of Battery Interfaces through Combined Analysis of Broadband Optical Backgrounds and Raman Features

Year: 2026

Type: article

Source: Nano Letters

DOI: 10.1021/acs.nanolett.6c04439

Authors: Shengfu Wei, Zhengcheng Gu, Yufeng Zhang, Weigang Ma, Aoran Fan, Xing Zhang

Institution: Tsinghua University

Language: English

Topic: Advanced Battery Materials and Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7225655729

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Cites: 45

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