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Equipment for On-Wafer Testing From 220 to 325 GHz

Year: 2006

Type: article

Source: NASA Technical Reports Server (NASA)

Authors: Lorene Samoska, Alejandro Peralta, Douglas Dawson, Karen Lee, Greg Boll, Chuck Oleson

Institution: California Institute of Technology

Language: English

Topic: Microwave Engineering and Waveguides

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W762837972

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