Work

Simple Schlieren Light Meter

Year: 1992

Type: article

Source: NASA Tech Briefs

Authors: David Rhodes, John M. Franke, Stephen B. Jones, Bradley D. Leighty

Institution: Langley Research Center

Language: German

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W840639599

FWCI:

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