Radiation Characterization of a 0.11 micrometer Modified Commercial CMOS Process
Year: 2006
Type: article
Authors: C. Poivey, H. Kim, M. Vilchis, James D. Forney, Anthony Phan, Kenneth A. LaBel, Rajan Saigusa, Rick Finlinson, A. Sukharnov, V. Hornback, Ji Yeon Song, J. Tung, S.M. Mirabedini
Institutions: MEI Technologies (United States), Goddard Space Flight Center
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W850678631