Work

Artifacts Frequently Encountered in Electron Micrographs

Year: 2005

Type: article

Source: Han-guk hyeonmigyeong hakoeji/Applied microscopy

Authors: Chang-Hyun Park, Kang-Yong Cho, Chang‐Sub Uhm

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W871707287

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