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Fabrication and Characterization of Thermal Probe Array on SOI Substrates

Year: 2005
Type: article
Abstract: This paper reports the fabrication and characterization of $5\;\times\;5$ thermal cantilever array for nano-scaled memory device application. The $5\;\times\;5$ thermal cantilever array with integrated tip heater has been fabricated with MEMS technology on SOI wafer using 7 photo masking steps. All single-level cantilevers have a diode in order to eliminate any electrical cross-talk between adjacent tips. Electrical measurements of fabricated thermal cantilever away show its own thermal heating mechanism. Thermal heating is demonstrated by the reflow of coated photoresist on the cantilever array surface.
Language: English
Open Access status: bronze
OpenAlex ID: W883430238
FWCI:
Cites: 1
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Related to: 10