Work

Serial Block-Face Imaging by Field Emission Scanning Electron Microscopy

Year: 2011

Type: article

Source: Han-guk hyeonmigyeong hakoeji/Applied microscopy

Author: Ki Woo Kim

Institution: Kyungpook National University

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W896330899

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Cites: 12

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Related to: 10