Work

V-mask Type Criterion for Identification of Outliers In Logistic Regression

Year: 2005

Type: article

Source: Communications for Statistical Applications and Methods

DOI: 10.5351/ckss.2005.12.3.625

Author: Bu-Yong Kim

Language: English

Topic: Advanced Statistical Methods and Models

Subfield: Statistics and Probability

Field: Mathematics

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W912893554

FWCI:

Cites: 12

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Related to: 10