Work

Phase separation study of annealed SiOx films through energy filtered scanning transmission electron microscope

Year: 2009

Type: book-chapter

Source: Springer eBooks

DOI: 10.1007/978-3-540-85156-1_208

Authors: G. Nicotra, C. Bongiorno, C. Spinella, E. Rimini

Institutions: Institute for Microelectronics and Microsystems, University of Catania

Language: English

Topic: Silicon Nanostructures and Photoluminescence

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W95768675

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Cites: 2

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Related to: 10