Work

X-ray microscopy using synchrotron radiation

Year: 1989

Type: article

Abstract: The system for x-ray microscopy now being developed at the X-26 beam line of the Brookhaven National Synchrotron Light Source (NSLS) is described here. Examples of the use of x-ray microscopy for trace element geochemistry, biology and medicine, and materials investigations are given to emphasize the scientific applications of the technique. Future directions for the improvement and further development of the X-26 microscope and of the x-ray microscopy field in general are discussed. 11 refs., 7 figs.

Source: University of North Texas Digital Library (University of North Texas)

Authors: K.W. Jones, B.M. Gordon, A.L. Hanson, Joel G. Pounds, Mark L. Rivers, G. Schidlovsky, J. V. Smith, P. Spanne, S.R. Sutton

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W96367574

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Related to: 10