Work

Ellipsometric Techniques to Study Surfaces and Thin Films

Year: 1979

Type: book-chapter

Source: Advances in electronics and electron physics

DOI: 10.1016/s0065-2539(08)60765-9

Authors: A.V. Rzhanov, K.K. Svitashev

Institutions: Institute of Semiconductor Physics, Academy of Sciences of the Soviet Union

Language: English

Topic: Optical Polarization and Ellipsometry

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W968170350

FWCI: 3.757

Cites: 164

Cited by: 17

Related to: 10