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Charles H. Dennison
Observed names:
C. H. Dennison,
Charles Dennison
Observed institution:
Micron (United States)
OpenAlex ID:
A5000327242
Nanocomposite Phase-Change Memory Alloys for Very High Temperature Data Retention
2010
·
Wally Czubatyj
, Stephen J Hudgens
, et al.
·
IEEE Electron Device Letters
·
32
Reliability and Characterization of Composite Oxide/Nitride Dielectrics for Multi‐Megabit Dynamic Random Access Memory Stacked Capacitors
1991
·
P. C. Fazan
, A. Ditali
, et al.
·
Journal of The Electrochemical Society
·
22
PDF
Characteristics of OUM Phase Change Materials and Devices for High Density Nonvolatile Commodity and Embedded Memory Applications
2003
·
Tyler A. Lowrey
, Stephen J. Hudgens
, et al.
·
MRS Proceedings
·
17
Oxide-nitride storage dielectrics on smooth and rough polycrystalline silicon layers
1991
·
P. C. Fazan
, A. Ditali
, et al.
·
Applied Physics Letters
·
7
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Works count:
4
Citation count:
78
H-index:
4
I10-index:
3
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