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Paul L. King

Observed names: P L King, P. King, P. L. King, P.L. King, Paul King
OpenAlex ID: A5000433496
Transistors with dual work function metal gates by single full silicidation (FUSI) of polysilicon gates
2003 · W.P. Maszara, Z. Krivokapic, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 72
Image processing of multispectral x-ray photoelectron spectroscopy images
1989 · P. L. King, R. Browning, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 44
Nickel silicide metal gate FDSOI devices with improved gate oxide leakage
2003 · Z. Krivokapic, W. Maszara, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 38
Core level photoelectron microscopy
1990 · P. Pianetta, P.L. King, et al. · Journal of Electron Spectroscopy and Related Phenomena · 35
Core level photoelectron microscopy with synchrotron radiation (invited)
1989 · P. Pianetta, I. Lindau, et al. · Review of Scientific Instruments · 30
Fermi-level inhomogeneities on the GaAs (110) surface imaged with a photoelectron microscope
1992 · Changyoung Kim, Paul L. King, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 20
Soft X-ray dosimetry and its application on the lithography beamline at SSRL
1988 · Daniel Seligson, Lawrence Pan, et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 19
Small area photoemission and photoabsorption measurements using a photoelectron microscope
1990 · P L King, A Borg, et al. · Physica Scripta · 16
Synchrotron-based X-ray lithography at Stanford University
1988 · L. Pan, P.L. King, et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 16
From small-area to imaging photoabsorption spectroscopy
1990 · P.L. King, A. Borg, et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 15
Ca 3dunoccupied states in Bi2 Sr2 CaCu2 O8 investigated by Ca L2,3 x-ray-absorption near-edge structure
1992 · A. Borg, P. L. King, et al. · Physical review. B, Condensed matter · 14
Radiation damage in boron nitride x-ray lithography masks
1988 · Paul L. King, Lawrence Pan, et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 14
Ge effects on silicidation
2005 · Paul R. Besser, Paul King, et al. · Microelectronic Engineering · 12
Synchrotron-based imaging with a magnetic projection photoelectron microscope
1991 · P.L. King, A. Borg, et al. · Ultramicroscopy · 12
Silicides for the 65 nm Technology Node
2003 · Paul R. Besser, Simon Chan, et al. · MRS Proceedings · 9
Artifacts in AES microanalysis for semiconductor applications
2000 · Paul L. King · Surface and Interface Analysis · 6
Characterization of the manufacturability of ultrathin resist
1999 · Khanh B. Nguyen, Chris Lyons, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 6
Self-aligned nickel, cobalt/tantalum nitride stacked-gate pMOSFETs fabricated with a low temperature process after metal electrode deposition
2003 · J. Pan, C. Woo, et al. · IEEE Transactions on Electron Devices · 5
Imaging band-pass analyzer using double 90° spherical analyzers
1993 · Changyoung Kim, Paul L. King, et al. · Review of Scientific Instruments · 5
Advanced techniques for contact module development
2002 · S. Zika, P.L. King, et al. · IEEE International Symposium on Semiconductor Manufacturing conference proceedings · 2
Manufacturability of the ultrathin resist process
2000 · Christopher Pike, Scott Bell, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
Quantitative Analysis Of X-Ray Images From Geological Materials
1990 · J. M. Paque, R. Browning, et al. · Proceedings annual meeting Electron Microscopy Society of America · 2
New Energy-Dependent Soft X-Rav Damage In MOS Devices
1988 · Tung-Yi Chan, Henry Gaw, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
X-Ray Induced Damage In Boron Nitride, Silicon, And Silicon Nitride Lithography Masks
1987 · Paul King, Lawrence Pan, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
Fermi Level Inhomogeneities on GaAs(110) Surface Imaged with a Photoelectron Microscope
1992 · Changyoung Kim, Paul L. King, et al. · MRS Proceedings
Works count: 29
Citation count: 397
H-index: 12
I10-index: 14
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