Author

Wilfried Noell

Observed names: NOELL, WILFRIED, Noell, Wilfried, W Noell, W. NOELL, W. Noell, Wilfried Noell (3979901)
OpenAlex ID: A5001237753
2002 · W. Noell, P.-A. Clerc, et al. · IEEE Journal of Selected Topics in Quantum Electronics · 127
2004 · Omar Manzardo, Roland Michaely, et al. · Optics Letters · 74
2000 · Rolf Eckert, J. Moritz Freyland, et al. · Applied Physics Letters · 73
2012 · Çağlar Ataman, Sébastien Lani, et al. · Journal of Micromechanics and Microengineering · 65
1997 · W. Noell, M. Abraham, et al. · Applied Physics Letters · 58
2010 · Roland Bitterli, Toralf Scharf, et al. · Optics Express · 44
2007 · Severin Waldis, Frederic Zamkotsian, et al. · IEEE Journal of Selected Topics in Quantum Electronics · 43
2006 · Michael Zickar, Wilfried Noell, et al. · Optics Express · 43
2013 · M D Canonica, F Zamkotsian, et al. · Journal of Micromechanics and Microengineering · 41
2004 · M. Sasaki, D. Briand, et al. · IEEE Journal of Selected Topics in Quantum Electronics · 39
1999 · D Drews, W Ehrfeld, et al. · Nanotechnology · 33
2016 · Myun-Sik Kim, Toralf Scharf, et al. · Optics Express · 32
2004 · Z.F. Wang, W. Cao, et al. · Sensors and Actuators A Physical · 31
2009 · N.F. de Rooij, S. Gautsch, et al. · International Conference on Solid-State Sensors, Actuators and Microsystems · 30
1998 · Michael Abraham, W Ehrfeld, et al. · Ultramicroscopy · 30
2010 · J. Charmet, O. Banakh, et al. · Thin Solid Films · 27
2001 · G. Genolet, M. Despont, et al. · Review of Scientific Instruments · 26
2000 · G Schürmann, W Noell, et al. · Ultramicroscopy · 25
2008 · A. Bich, J. Rieck, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 24
2001 · L. Dellmann, W. Noell, et al. · Springer eBooks · 24
2008 · Frederic Zamkotsian, Emmanuel Grassi, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 17
Works count: 218
Citation count: 1,455
H-index: 22
I10-index: 37
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