Author

Ute Geisler

Observed name: U. Geisler

Institution: Technical University of Applied Sciences Wildau

Observed institutions: Technical University of Applied Sciences Wildau, Technische Universität Berlin

OpenAlex ID: A5008725751

Interface degradation of Al heavy wire bonds on power semiconductors during active power cycling measured by the shear test

2010 · Jens Goehre, Martin Schneider‐Ramelow, et al. · Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft) · 54

Zur Kristallchemie der Vanadin(III)‐Spinelle

1969 · B. Reuter, E. Riedel, et al. · Zeitschrift für anorganische und allgemeine Chemie · 49

Modeling and Fabrication of an Antireflection Microstructure on an AgClBr Fiber by Single-pulse Femtosecond Laser Ablation

2021 · Mikhail Tarabrin, Andrey Bushunov, et al. · Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)

Works count: 3

Citation count: 103

H-index: 2

I10-index: 2