Author

Jan Meiser

Observed names: J Meiser, J. Meiser, Meiser, Jan
Observed institution: Karlsruhe Institute of Technology
OpenAlex ID: A5010409758
2012 · Arne Tapfer, Martin Bech, et al. · Proceedings of the National Academy of Sciences · 152
2012 · Jürgen Mohr, Thomas Grund, et al. · AIP conference proceedings · 89
2016 · Lorenz Birnbacher, Marian Willner, et al. · Scientific Reports · 69
2017 · Tobias J. Schröter, Frieder J. Koch, et al. · Review of Scientific Instruments · 52
2014 · Andre Yaroshenko, Martin Bech, et al. · Optics Express · 32
2016 · J. Meiser, M. Willner, et al. · Journal of X-Ray Science and Technology · 22
2013 · T. Thüring, S. Hämmerle, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 20
2014 · P. Modregger, S. Rutishauser, et al. · Applied Physics Letters · 17
2015 · F. J. Koch, T. J. Schröter, et al. · Review of Scientific Instruments · 16
2014 · J. Fu, T. Biernath, et al. · Europhysics Letters (EPL) · 16
2014 · Georg Pelzer, Andrea Zang, et al. · Optics Express · 14
2013 · Danays Kunka, Jürgen Mohr, et al. · Microsystem Technologies · 14
2015 · F Koch, F Marschall, et al. · Journal of Micromechanics and Microengineering · 9
2014 · J. Meiser, M. Amberger, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
2017 · Meiser, Jan · Repository KITopen (Karlsruhe Institute of Technology)
2014 · Markus Schüttler, Andre Yaroshenko, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
2013 · Maximilian Amberger, Klaus Bade, et al. · ECS Transactions
2012 · Maximilian Amberger, Klaus Bade, et al. · ECS Meeting Abstracts
Works count: 21
Citation count: 582
H-index: 14
I10-index: 14
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