Author

Stefan J. Murry

Observed names: MURRY, STEFAN J., S. J. Murry, S. Murry, S.J. Murry, Stefan John Murry, Stefan Murry
OpenAlex ID: A5010527872
1997 · Lin, Yang, et al. · Electronics Letters · 165
1997 · Rui Q. Yang, B. H. Yang, et al. · Applied Physics Letters · 126
1996 · J. I. Malin, J. R. Meyer, et al. · Applied Physics Letters · 81
1998 · B. H. Yang, D. Zhang, et al. · Applied Physics Letters · 79
1997 · C.L. Felix, J.R. Meyer, et al. · IEEE Photonics Technology Letters · 61
1997 · Rui Q. Yang, Chih-Hsiang Lin, et al. · Applied Physics Letters · 59
1996 · J.I. Malin, C.L. Felix, et al. · Electronics Letters · 54
1998 · W. W. Bewley, I. Vurgaftman, et al. · Journal of Applied Physics · 53
1996 · R.Q. Yang, C.-H. Lin, et al. · Electronics Letters · 37
1997 · Chih-Hsiang Lin, S.J. Murry, et al. · Journal of Crystal Growth · 32
1997 · W. W. Bewley, E. H. Aifer, et al. · Applied Physics Letters · 31
1998 · C. L. Felix, W. W. Bewley, et al. · Journal of Electronic Materials · 21
1997 · Chih-Hsiang Lin, Rui Q. Yang, et al. · IEEE Photonics Technology Letters · 19
1997 · Chih-Hsiang Lin, P. C. Chang, et al. · Journal of Electronic Materials · 12
1998 · Rui Q. Yang, C.H. T. Lin, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6
1995 · H. C. Chen, A. B. Rane, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 6
1998 · Shin Shem Pei, C.H. T. Lin, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
1997 · C.H. T. Lin, Rui Q. Yang, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
2002 · R.Q. Yang, Chih-Hsiang Lin, et al. · IEEE Lasers and Electro-Optics Society Annual Meeting (LEOS) · 1
2000 · W.-Y. Hwang, S.V. Zaitsev, et al. · Conference on Lasers and Electro-Optics · 1
1999 · Chlh-Hsiang Lin, W.-Y. Hwang, et al. · MRS Proceedings · 1
1998 · Chih-Hsiang Lin, S. J. Murry, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1
1998 · I. Vurgaftman, L.J. Olafsen, et al. · Conference on Lasers and Electro-Optics · 1
1997 · Rui Q. Yang, C.H. T. Lin, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
Works count: 65
Citation count: 854
H-index: 13
I10-index: 14
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