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Author

Clayton R. Farias

Observed name: Clayton Farias
ORCID: 0009-0003-8259-7647
Observed ORCID: 0009-0003-8259-7647
OpenAlex ID: A5014665201
Evaluating Soft Error Reliability of Combinational Circuits Using a Monte Carlo Based Method
2022 · Clayton R. Farias, Rafael B. Schvittz, et al. · IEEE Latin American Test Symposium (LATS) · 9
Survey on Reliability Estimation in Digital Circuits
2021 · Matheus Ferreira Pontes, Clayton Farias, et al. · Journal of Integrated Circuits and Systems · 7
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Cross-Section Estimation for Assessment of Circuit Susceptibility to Radiation
2024 · Clayton R. Farias, Tiago R. Balen, et al. · IEEE Latin American Test Symposium (LATS) · 2
A Fast Approximate Function Generation Method to ATMR Architecture
2022 · Guilherme B. Manske, Clayton R. Farias, et al. · IEEE Latin American Symposium on Circuits and Systems (LASCAS) · 2
CREsT - Uma Ferramenta para o Auxílio do Ensino de Confiabilidade em Circuitos Digitais
2021 · Laura Quevedo Jurgina, Matheus F. Pontes, et al. · Anais do ... Simpósio Brasileiro de Informática na Educação/Anais do Simpósio Brasileiro de Informática na Educação · 2
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Fast Statistical Estimation of Circuit-Level Cross Section Considering Logical Masking Effects
2026 · Clayton R. Farias, Tiago R. Balen, et al. · IEEE Latin American Test Symposium (LATS)
RISC-V Area-Optimized ASIC Design with a Multi-Height 7nm FinFET Standard Cell Library
2026 · Matheus Lemos, Clayton R. Farias, et al. · IEEE Latin American Symposium on Circuits and Systems (LASCAS)
A Procedure for Fast Circuit Cross Section Estimation
2026 · Clayton R. Farias, Tiago R. Balen, et al. · Chips
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Improving Circuit Area with a 7Nm Predictive FinFET PDK Multi-Height Standard Cell Library
2025 · Matheus Lemos, Clayton R. Farias, et al. · IEEE Latin America Symposium on Circuits and Systems (LASCAS)
Works count: 9
Citation count: 22
H-index: 2
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