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S. Mikhailov

Observed name: S Mikhailov
ORCID: 0009-0003-0440-1979
Observed ORCID: 0009-0003-0440-1979
OpenAlex ID: A5016169265
Hydrogen in amorphous and microcrystalline silicon films prepared by hydrogen dilution
1996 · U. Kroll, J. Meier, et al. · Journal of Applied Physics · 290
a-C:H thin films deposited by radio-frequency plasma: influence of gas composition on structure, optical properties and stress levels
2001 · E Tomasella, C Meunier, et al. · Surface and Coatings Technology · 96
Nanostructural and mechanical properties of nanocomposite nc-TiC/a-C:H films deposited by reactive unbalanced magnetron sputtering
2004 · T. Zehnder, P. Schwaller, et al. · Journal of Applied Physics · 87
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Structural, morphological, chemical and tribological investigations of sputter deposited MoS /metal multilayer coatings
1998 · M.C Simmonds, A Savan, et al. · Surface and Coatings Technology · 85
Morphology and tribological properties of metal (oxide)–MoS2 nanostructured multilayer coatings
1998 · S Mikhailov, A Savan, et al. · Surface and Coatings Technology · 85
Friction properties of ta-C and a-C:H coatings under high vacuum
2005 · C. Meunier, P. Alers, et al. · Surface and Coatings Technology · 39
High aspect ratio, 3D structuring of photoresist materials by ion beam LIGA
2003 · F. Munnik, F. Benninger, et al. · Microelectronic Engineering · 36
Comparison of hydrogenated and unhydrogenated carbon films obtained by FCVA onto Ti6Al4V: Structure, hardness and biocompatibility study
2005 · C. Meunier, Y. Stauffer, et al. · Surface and Coatings Technology · 22
X-Ray reflectometry study of diamond-like carbon films obtained by plasma-assisted chemical vapor deposition
2001 · C. Meunier, E. Tomasella, et al. · Diamond and Related Materials · 22
Coupled effects of bombarding ions energy on the microstructure and stress level of RFPECVD a-C:H films: correlation with Raman spectroscopy
2003 · E. Tomasella, L. Thomas, et al. · Surface and Coatings Technology · 14
Tribological properties of bias voltage modulated a-C:H nanoscaled multilayers
1997 · L. Knoblauch, R. Hauert, et al. · Surface and Coatings Technology · 13
Magnetron sputter deposition and characterisation of Ti/TiN, Au/TiN and MoSX/Pb multilayers
1997 · M.C. Simmonds, H. Van Swygenhoven, et al. · Surface and Coatings Technology · 12
Rapid and direct micro-machining/patterning of polymer materials by oxygen MeV ion beam irradiation through masks
2011 · S. Brun, G. Guibert, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 11
Dual FCVA–PECVD deposition for DLC films
2005 · C. Meunier, F. Munnik, et al. · Thin Solid Films · 10
Depth profiles study of n(TiN+AlN) bilayers systems by GDOES and RBS techniques
2003 · A. Thobor, C. Rousselot, et al. · Surface and Coatings Technology · 10
Solid state reaction of Mo on H-terminated surface of diamond thin films
1995 · S. Mikhailov, J. Weber, et al. · Solid State Communications · 9
Deuterium influence on optical gap of amorphous carbon diamond-like carbon (DLC) thin film
2007 · N. Mathis, C. Meunier, et al. · Thin Solid Films · 7
DLC films on LiTaO3 for SAW devices
2004 · C. Meunier, F. Munnik, et al. · Surface and Coatings Technology · 7
Effect on microstructure and hardness of 1 MeV carbon ion implantation in Al, Co and W
2014 · C. Meunier, S. Vives, et al. · Surface and Coatings Technology · 6
Deuterated Diamond Like Carbon films (DDLC): Mechanical properties in relation with microstructure
2007 · N. Mathis, C. Meunier, et al. · Surface and Coatings Technology · 6
Study of new sheep bone and Zn/Ca ratio around TiAlV screw: PIXE–RBS analysis
2008 · G. Guibert, F. Munnik, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 4
Surface Treatment of Polymers by Ion Beam Irradiation to Control the Human Osteoblast Adhesion: Fluence and Current Density Study
2009 · G. Guibert, T. Rossel, et al. · AIP conference proceedings · 3
Control of Human Osteoblast adhesion on polymers after ion beam irradiation
2008 · Gilles Weder, S. Mikhailov, et al.
Works count: 23
Citation count: 874
H-index: 12
I10-index: 15
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