Author

Jang Hwan Tae

Institution: Samsung Electronics (South Korea)

Observed institutions: Samsung (South Korea), Samsung Advanced Institute of Technology (South Korea), Samsung Electronics (South Korea)

OpenAlex ID: A5016675868

Comparative analysis of wavefront aberrations between plano-convex lenses and metalenses

2024 · Chan-Wook Baik, Jungho Moon, et al. · Metamaterials, Metadevices, and Metasystems

Wavefront analysis of subwavelength dielectric metalenses

2020 · Chan-Wook Baik, Jang Hwan Tae, et al.

Wavefront control for flat optics using subwavelength dielectric metasurfaces (Conference Presentation)

2018 · Chan-Wook Baik, Heejeong Jeong, et al.

Works count: 3

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