Author

Adam Seeger

Observed names: A. Seeger, A. von Seeger, ADAM SEEGER

Institution: Intel (United States)

Observed institutions: University of Stuttgart, University of North Carolina at Chapel Hill, Intel (United States), Max Planck Society, Georgetown University

ORCID: 0000-0001-6962-9403

Observed ORCID: 0000-0001-6962-9403

OpenAlex ID: A5016679080

2001 · Russell M. Taylor, Thomas C. Hudson, et al. · ACM Symposium on Virtual Reality Software and Technology (VRST) · 487

Controlled placement of an individual carbon nanotube onto a microelectromechanical structure

2002 · P. A. Williams, S. J. Papadakis, et al. · Applied Physics Letters · 122

Formation and decay of spherical concentric-shell carbon clusters

1996 · M.S. Zwanger, F. Banhart, et al. · Journal of Crystal Growth · 61

Mechanical and optical manipulation of porphyrin rings at the submicrometre scale

2000 · Philippe Foubert, Peter Vanoppen, et al. · Nanotechnology · 22

Factors contributing to the integration of textural qualities: Evidence from virtual surfaces

2005 · Mark Hollins, Florian Lorenz, et al. · Somatosensory & Motor Research · 19

Haptic Perception of Virtual Surfaces: Scaling Subjective Qualities and Interstimulus Differences

2004 · Mark Hollins, Adam Seeger, et al. · Perception · 14

Software acceleration techniques for the simulation of scanning electron microscope images

2003 · Adam Seeger, Charalampos Fretzagias, et al. · Scanning · 13

2001 · Russell M. Taylor, Thomas C. Hudson, et al. · ACM Symposium on Virtual Reality Software and Technology (VRST) · 13

Detection of moving objects through turbulent media. Decomposition of Oscillatory vs Non-Oscillatory spatio-temporal vector fields

2018 · J. Gilles, F. Alvarez, et al. · Image and Vision Computing · 11

Scanning electron microscope charging effect model for chromium/quartz photolithography masks

2006 · Adam Seeger, Alessandro Duci, et al. · Scanning · 11

Surface reconstruction from afm and sem images

2004 · Russell M. Taylor, Adam Seeger · 10

Four generations of high-voltage electron microscopes

1999 · A. Seeger · Journal of Electron Microscopy · 10

Hands-on tools for nanotechnology

2001 · A. Seeger, S. Paulson, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 7

Shape‐from‐shading and simulation of SEM images using surface slope and curvature

2005 · Adam Seeger, Horst Haussecker · Surface and Interface Analysis · 6

Visualization and Natural Control Systems for Microscopy

2005 · RUSSELL M. TAYLOR, DAVID BORLAND, et al. · Elsevier eBooks · 3

Convolutional neural network approach to enhance mask registration accuracy on arbitrary design patterns

2026 · Vivek Mishra, Adam Seeger, et al. · SPIE Photomask Technology Conference

2005 · James Ahrens, Mihael Ankerst, et al. · Elsevier eBooks

MEMS devices as test instruments for nanometer-scale physics

2002 · S. J. Papadakis, Phillip Williams, et al. · APS

Progress on Single Walled Carbon Nanotube Junction Devices

2001 · Neal Snider, Phillip Williams, et al. · APS March Meeting Abstracts

Inter-bundle Electronic Transport in Single Walled Carbon Nanotubes

2000 · Neal Snider, Scott Paulson, et al. · APS March Meeting Abstracts

Elasticity and Binding of Adenovirus

1999 · Garrett Matthews, Atsuko Negishi, et al. · APS

Electronic Interaction Between Single-Wall Carbon Nanotube Bundles

1999 · Neal Snider, Scott Paulson, et al. · APS

In-situ TEM study of a new phase of the Au-Cu-system

1996 · Xiaoqing Pan, F. Sigle, et al. · University of Groningen research database (University of Groningen / Centre for Information Technology)

Works count: 25

Citation count: 809

H-index: 10

I10-index: 12