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F. Lemaire
Observed name:
Lemaire, Frederic
Institution:
Thales (France)
Observed institution:
Thales (France)
OpenAlex ID:
A5018917056
Temperature measurement in AlGaN/GaN High-Electron-Mobility Transistors using micro-Raman scattering spectroscopy
2005
·
R. Aubry
, C. Dua
, et al.
·
The European Physical Journal Applied Physics
·
17
Temperature measurement by micro-Raman scattering spectroscopy in the active zone of AlGaN/GaN high-electron-mobility transistors
2004
·
R. Aubry
, C. Dua
, et al.
·
The European Physical Journal Applied Physics
·
11
A fully integrated silicon-germanium X-Band VCO
2001
·
Masini, Leonardo
, Pozzoni, Massimo
, et al.
·
AMS Acta (University of Bologna)
·
2
PDF
Temperature Distributions in III-V and SiC Micro-Wave Power Transistors Using Spatially Resolved Photoluminescence and Raman-Spectrometry Mapping Respectively
2000
·
P. Martin
, R. Bisaro
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
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Works count:
4
Citation count:
30
H-index:
2
I10-index:
2
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