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Bert Pfefferling
Observed names:
B. Pfefferling,
Pfefferling, B.
Institution:
GlobalFoundries (Germany)
Observed institutions:
GlobalFoundries (United States),
GlobalFoundries (Singapore),
GlobalFoundries (Germany)
OpenAlex ID:
A5019685406
Manufacturable 22nm FD-SOI Embedded MRAM Technology for Industrial-grade MCU and IOT Applications
2019
·
V. B. Naik
, K. Lee
, et al.
·
Technical digest - International Electron Devices Meeting/Technical digest
·
78
JEDEC-Qualified Highly Reliable 22nm FD-SOI Embedded MRAM For Low-Power Industrial-Grade, and Extended Performance Towards Automotive-Grade-1 Applications
2020
·
V. B. Naik
, K. Yamane
, et al.
·
Technical digest - International Electron Devices Meeting/Technical digest
·
49
Extended MTJ TDDB Model, and Improved STT-MRAM Reliability With Reduced Circuit and Process Variabilities
2022
·
V. B. Naik
, J. H. Lim
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
15
STT-MRAM: A Robust Embedded Non-Volatile Memory with Superior Reliability and Immunity to External Magnetic Field and RF Sources
2021
·
V. B. Naik
, K. Yamane
, et al.
·
Symposium on VLSI Technology
·
11
STT-MRAM Product Reliability and Cross-Talk
2022
·
V. B. Naik
, K. Yamane
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
5
Embedded STT-MRAM for Automotive Applications
2024
·
J. Müller
, B. Pfefferling
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
4
Optimization of the interconnect resistance contribution for STT-MRAM technology
2019
·
Hemant Dixit
, Sudarshan Narayanan
, et al.
·
Microelectronics Journal
·
4
High Purity Deposition of Silicon Layers with Rates ≥ 300 nm/s
2015
·
Heinß, J.-P.
, Pfefferling, B.
, et al.
·
Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft)
·
3
From Emergence to Prevalence: 22FDX® Embedded STT-MRAM
2022
·
Johannes Müller
, Aleksandra Titova
, et al.
·
IEEE International Memory Workshop (IMW)
·
2
Improved Throughput and Cost of Ownership for Monitoring of FBEOL Etch Profile
2023
·
Padraig Timoney
, Carrie Yurkon
, et al.
·
ASMC proceedings
·
1
High-Rate Deposition of Si Absorber Layers by Electron Beam Evaporation and First Electron Beam Crystallization Tests
2014
·
Saager, S.
, Ben Yaala, M.B.
, et al.
·
Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft)
·
1
Magnetic Immunity in STT-MRAM a Rational Approach to a Manageable Challenge
2026
·
Johannes Mueller
, Frank Schlaphof
, et al.
·
IEEE International Magnetic Conference - Short Papers (INTERMAG Short Papers)
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Works count:
12
Citation count:
173
H-index:
5
I10-index:
4
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