Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
Wu Dai
Institution:
Peking University
Observed institution:
Peking University
ORCID:
0000-0003-1054-9550
Observed ORCID:
0000-0003-1054-9550
OpenAlex ID:
A5021588508
Statistical Compact Modeling With Artificial Neural Networks
2023
·
Wu Dai
, Yu Li
, et al.
·
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
·
13
Benchmarking Artificial Neural Network Models for Design Technology Co-optimization
2023
·
Wu Dai
, Yu Li
, et al.
·
International Symposium of Electronics Design Automation (ISEDA)
·
10
A Surface Potential Based Full-Region Current Model for Doping Segregated TFETs
2023
·
Fangxing Zhang
, Hao Li
, et al.
·
IEEE Transactions on Electron Devices
·
8
Generic Compact Modeling of Emerging Memories With Recurrent NARX Network
2023
·
Zhao Rong
, Wu Dai
, et al.
·
IEEE Electron Device Letters
·
7
PDF
An Automatic Integration Network Approach for Generic Device Charge Modeling
2022
·
Wu Dai
, Fangxing Zhang
, et al.
·
IEEE International Conference on Solid-State & Integrated Circuit Technology (ICSICT)
·
4
When Device Modeling Meets Machine Learning: Opportunities and Challenges (Invited)
2024
·
Lining Zhang
, Baokang Peng
, et al.
·
3
When Device Modeling Meets Machine Learning: Opportunities and Challenges (Invited)
2024
·
Lining Zhang
, Baokang Peng
, et al.
·
3
Capacitance Modeling With Charge Partitions Covering Full-Region Operations of TFETs
2024
·
Fangxing Zhang
, Wu Dai
, et al.
·
IEEE Transactions on Electron Devices
·
3
A Neural Network-based Framework for Accelerated Device-Circuit Electrothermal Co-Simulations in GAAFETs
2024
·
Hengyi Liu
, Sihao Chen
, et al.
·
International Symposium of Electronics Design Automation (ISEDA)
·
3
An Automatic Parameter Extraction Method Based on Autoencoder for PIN Diode Model
2022
·
Yu Li
, Wu Dai
, et al.
·
IEEE International Conference on Solid-State & Integrated Circuit Technology (ICSICT)
·
3
A Neural Network based Fast Parameter Extraction of Compact Hot Carrier Degradation Model in FinFETs
2024
·
Cong Shen
, Yu Li
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
2
A Physics-Informed Neural Network Model for Body Potential Distribution in MOSFETs Down to 50 K
2024
·
Honglin Wu
, Fangxing Zhang
, et al.
·
1
Show more works
View as search
Works count:
12
Citation count:
60
H-index:
4
I10-index:
2
Year
Topic
Type
