Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
G. Jonsson
Observed name:
Goran Jonsson
Institution:
Lund University
Observed institutions:
Lund University,
United Monolithic Semiconductors (Germany)
OpenAlex ID:
A5022434732
Mobile Electrostatic Carrier (MEC) evaluation for a GaAs wafer backside manufacturing process
2010
·
Hermann Stieglauer
, J. Nösser
, et al.
·
Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft)
·
2
Comparison of two SiGe 2-stage E-band power amplifier architectures
2016
·
Tobias Tired
, Henrik Sjoland
, et al.
·
IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)
·
1
Reliability of high voltage/high power L/S-band Hbt technology
2010
·
B. Lambert
, G. Jonsson
, et al.
·
Microelectronics Reliability
Industrial GaInP/GaAs high Power HBT Process for S-Band and L-Band Applications
2007
·
H. Blanck
, G. Jonsson
, et al.
Show more works
View as search
Works count:
5
Citation count:
3
H-index:
1
I10-index:
Year
Topic
Type
