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Author

Loukas Chevas

Observed name: Chevas, Loukas
Observed institution: Technical University of Crete
ORCID: 0000-0002-2891-1178
Observed ORCID: 0000-0002-2891-1178
OpenAlex ID: A5031908174
Generalized Constant Current Method for Determining MOSFET Threshold Voltage
2020 · Matthias Bucher, Nikolaos Makris, et al. · IEEE Transactions on Electron Devices · 26
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Total ionizing dose effects on analog performance of 65 nm bulk CMOS with enclosed-gate and standard layout
2018 · Matthias Bucher, Aristeidis Nikolaou, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 26
Investigation of Scaling and Temperature Effects in Total Ionizing Dose (TID) Experiments in 65 nm CMOS
2018 · Loukas Chevas, Aristeidis Nikolaou, et al. · 11
Modeling of High Total Ionizing Dose (TID) Effects for Enclosed Layout Transistors in 65 nm Bulk CMOS
2018 · Aristeidis Nikolaou, Matthias Bucher, et al. · CAS proceedings · 8
Extending a 65nm CMOS process design kit for high total ionizing dose effects
2018 · Aristeidis Nikolaou, Matthias Bucher, et al. · International Conference on Modern Circuits and Systems Technologies · 6
Compact Modeling of Low Frequency Noise and Thermal Noise in Junction Field Effect Transistors
2019 · Nikolaos Makris, Loukas Chevas, et al. · European Solid-State Device Research Conference · 5
Free Carrier Mobility, Series Resistance, and Threshold Voltage Extraction in Junction FETs
2020 · Nikolaos Makris, Matthias Bucher, et al. · IEEE Transactions on Electron Devices · 4
Design of Micropower Operational Transconductance Amplifiers for High Total Ionizing Dose Effects
2019 · Alexia Papadopoulou, Nikolaos Makris, et al. · International Conference on Modern Circuits and Systems Technologies · 3
Noise Propagation and Statistic Variability in MOSFETs Using Probability Density Functions
2025 · Raphael Chatzipantelis, Loukas Chevas, et al. · Fluctuation and Noise Letters · 2
A Contribution to GaN HEMT Modeling and Parameter Extraction Including Temperature Dependence
2022 · Loukas Chevas, Nikolaos Makris, et al. · IEEE Latin American Electron Devices Conference (LAEDC) · 2
Methodology for Harmonic Distortion Characterization and Modelling of GaN HEMT Varactors
2026 · Loukas Chevas, Matthias Bucher, et al. · Instruments
Harmonic Distortion Modeling of Inversion-Mode Bulk Mosfet and Finfet Capacitors
2025 · Loukas Chevas, Nikolaos Makris, et al.
Verilog-A based implementation of Lorentzian noise spectra in compact models
2023 · Nikolaos Makris, Loukas Chevas, et al. · International Conference on Noise and Fluctuations
Transconductance-to-Current Ratio Based Threshold Voltage Extraction in MOSFETs from Linear to Saturation Modes
2023 · Matthias Bucher, Nikolaos Makris, et al. · IEEE Latin American Electron Devices Conference (LAEDC)
Forward and Reverse Operation of Enclosed-Gate MOSFETs and Sensitivity to High Total Ionizing Dose
2019 · Aristeidis Nikolaou, Loukas Chevas, et al. · International Conference Mixed Design of Integrated Circuits and Systems
Works count: 16
Citation count: 93
H-index: 5
I10-index: 3
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