Author

Jae-Sung Lee

Institution: Uiduk University

Observed institutions: Uiduk University, Kyungpook National University

ORCID: 0000-0001-5363-4566

Observed ORCID: 0000-0001-5363-4566

OpenAlex ID: A5032898404

Effect of ALD Processes on Physical and Electrical Properties of HfO 2 Dielectrics for the Surface Passivation of a CMOS Image Sensor Application

2022 · Honggyun Kim, Vijay D. Chavan, et al. · IEEE Access · 21

Negative Bias Temperature Instability of Bulk Fin Field Effect Transistor

2006 · Sang-Yun Kim, Kyoung-Rok Han, et al. · Japanese Journal of Applied Physics · 8

Hydrogen-related extrinsic oxide trap generation in thin gate oxide film during negative-bias temperature instability stress

2004 · Jae-Sung Lee, J.W. Lyding, et al. · IEEE International Reliability Physics Symposium proceedings · 7

Method for improving electrical property of polysilicon film used to light absorption layer of photodetector

2022 · Jae-Sung Lee · Journal of the Korean Physical Society · 2

Isotope Effect in Electrical Characteristics of Polysilicon Based-Photodetector

2023 · Jae-Sung Lee · IEEE Transactions on Electron Devices · 1

Photoconductive Properties of Polycrystalline Silicon Thin Film Annealed at High Pressure of Deuterium

2024 · Jae-Sung Lee · IEEE Access

Works count: 6

Citation count: 39

H-index: 3

I10-index: 1